Measurement Systems

Vacuum deposition  chamber 1

Vacuum deposition chamber 1 This chamber is evacuated by turbo molecular pump (ultimate pressure <10-5 Pa). This chamber has cryogenic sample table (table temperature >34K). This chamber is used to prepare a transparent electrode.

Vacuum deposition chamber 2

Vacuum deposition chamber 2 This chamber is evacuated by diffusion pump (ultimate pressure <10-4 Pa). We usually use this chamber for preparation of organic semiconductor transistors, solar cell, and EL devices.

Kyowakaimen Kagaku Langmuir troughLB Film Lab

Kyowa Kaimen Kagaku Langmuir trough LB Film Lab This trough is used for fabrication of monolayer and multilayer of amphiphilic molecules by using Langmuir-Blodgett technique. In this trough, reflection spectra of monolayer can be measured simultaneously during surface pressure-are isotherm measurement.

Kyowa RIken Spin-Coater K-357 S1

Kyowa Riken Spin-Coater K-357 S1

NIHON LASER & ELECTRONICS UV Ozone Cleaner NLUV2535

NIHON LASER & ELECTRONICS UV Ozone Cleaner NLUV2535 The cleaner removes completely organic pollution on substrates by decomposition using UV-generated ozone gas and makes the surface of substrate hydrophilic.

SHIMAZU Co. UV-vis spectrophotometer UV-2400PC

SHIMAZU Co. UV-vis spectrophotometer UV-2400PC

JASCO spectrofluorometer FP750

JASCO spectrofluorometer FP750

JASCO FTIR FT/IR410

JASCO FTIR FT/IR410 We can measure reflection absorption spectrum (RAS).

HAMAMATSU PHOTONICS Photoluminescence and electroluminescence quatum yield measurement system

HAMAMATSU PHOTONICS Photoluminescence and electroluminescence quantum yield measurement system This system have two optical integrating sphere. One is for photoluminescence. Another is for emissive devices such as OLEDs.

Transient spectrophotometer

Transient spectrophotometer This system consists of HAMAMATSU PHONICS PMA100, IWATANI 4K-cryostat、Continuum Nd:YAG laser. We can measure transient absorption, photoluminescence, and Raman spectra using this system.

EDINBURGH INSTRUMENTS transient photoluminescence life time measurement system  LifeSpec-ps

EDINBURGH INSTRUMENTS transient photoluminescence life time measurement system LifeSpec-ps Excitation source is a semiconductor laser (378 nm, pulse width 72 ps)

Organic EL measurement system

Organic EL measurement system This system consists of Hamamatsu Photonics multichannel spectrophotometer PMA10, Keythley Source Meter 2400, MINOLTA Luminance meter LS100 and digital oscilloscope IWATSU-LeCroy LT342. Voltage-current-luminance and transient EL measurements are automated in this system.

Solar cell measurement system

Solar cell measurement system We evaluate organic solar cell performance using USHIODENKI solar simulator X500.

Agilent Technology Semiconductor device analyzer B1500A

Agilent Technology Semiconductor device analyzer B1500A We use this analyzer for evaluation of organic semiconductor transistors and solar cells.

Time-of-Flight measurement system

Time-of-Flight measurement system This system consists of 10K-optical cryostat and N2 laser and IWATSU digital oscilloscope. We evaluate carrier mobility of thin film materials using Time-of-Flight technique.

Waveguide and surface plasmon measurement system

Waveguide and surface plasmon measurement system We determine refractive index of thin film materials using waveguide and surface plasmon measurements.

Electromodulation spectroscopy system 1

Electromodulation spectroscopy system 1 This system consists of Zenon lamp, deuterium lamp, and halogen lamp as light source, NF ELECTRONIC INSTRUMENT function synthesizer WF1945、bipolar amplifier HSA4011, lock'in amplifier 5610. Using this system, we measure elelctromodulation spectra of thin films and evaluate molecular hyper-polarizability β and γ, nonlinear susceptibility of thin films χ(2) and χ(3), asymmetrical molecular orientation in thin films.

Electromodulation spectroscopy system 2

Electromodulation spectroscopy system 2

Electromodulation Raman Spectrophotometer

Electromodulation Raman Spectrophotometer Now, under construction. Using this spectrometer, we plan the study on carrier formation and transportation mechanisms in organic semiconductors.

HOKUTODENKO Electrochemical measurement system HZ-5000

HOKUTODENKO Electrochemical measurement system HZ-5000 We use the measurement system for determination of electron affinity and ionization potential of organic semiconductors by cyclic voltammetry. We can also measure UV-vis spectroscopic change during electrochemical reaction by using Ocean Optics multichannel spectrophotometer.

SEIKO Instrument AFM SPA400

SEIKO Instrument AFM SPA400 We have two types of stage 20μmx20μm and 100μmx100μm. We can observe wide range area from molecular scale to 0.1 mm scale. We can also measure current-voltage characteristics in nanometer scale region.

NIKON Polarized microscope E4BP-M22

NIKON Polarized microscope E4BP-M22 By combining OXFORD INSRUMENT Ministat N, we use observation of phase transition behavior of liquid crystalline materials.

SEIKO INSTRUMENTS Differencial scanning calorymeter EXSTER 6000

SEIKO INSTRUMENTS Differencial scanning calorymeter EXSTER 6000 This system is for measurement of phase transition temperature and enthalpy change ΔH and entropy change ΔS at the phase transition temperature.

Saver for quantum mechanical calculation

Saver for quantum mechanical calculation We conduct quantum mechanical calculation using two software (Gamess and Gaussian).

High pressure liquid chromatography systems

High pressure liquid chromatography systems We have two HPLC. One is used for purification of target compounds and with large size column. Another is for analyzing the purity of prepared compounds.

YAMAZEN Midium pressure liquid chromatography system FR-360

YAMAZEN Midium pressure liquid chromatography system FR-360 Automated MPLC system.

Train sublimation purification system

Train sublimation purification system

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